Reflection ellipsometry for in-situ measurements of complex permittivity and thickness of a single-layer material at microwave frequencies : Theory and Experiments

Document type :
Conference papers
Complete list of metadatas

https://hal-upec-upem.archives-ouvertes.fr/hal-00621814
Contributor : Christophe Vignat <>
Submitted on : Sunday, September 11, 2011 - 1:14:31 PM
Last modification on : Wednesday, April 11, 2018 - 12:12:02 PM

Identifiers

  • HAL Id : hal-00621814, version 1

Citation

F. Sagnard, D. Seetharamdoo, Christophe Vignat. Reflection ellipsometry for in-situ measurements of complex permittivity and thickness of a single-layer material at microwave frequencies : Theory and Experiments. 32nd EUMC, Sep 2002, Milan, France. 10pp. ⟨hal-00621814⟩

Share

Metrics

Record views

83