Reflection ellipsometry for in-situ measurements of complex permittivity and thickness of a single-layer material at microwave frequencies : Theory and Experiments

F. Sagnard; D. Seetharamdoo; Christophe Vignat

Conference papers

Reflection ellipsometry for in-situ measurements of complex permittivity and thickness of a single-layer material at microwave frequencies : Theory and Experiments

F. Sagnard D. Seetharamdoo Christophe Vignat ¹

1 LIGM - Laboratoire d'Informatique Gaspard-Monge

Document type :

Conference papers

Domain :

Computer Science [cs] / Computation and Language [cs.CL]

Complete list of metadata

https://hal-upec-upem.archives-ouvertes.fr/hal-00621814
Contributor : Christophe Vignat Connect in order to contact the contributor
Submitted on : Sunday, September 11, 2011 - 1:14:31 PM
Last modification on : Tuesday, October 19, 2021 - 11:26:00 AM

Reflection ellipsometry for in-situ measurements of complex permittivity and thickness of a single-layer material at microwave frequencies : Theory and Experiments

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Reflection ellipsometry for in-situ measurements of complex permittivity and thickness of a single-layer material at microwave frequencies : Theory and Experiments

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