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Reflection ellipsometry for in-situ measurements of complex permittivity and thickness of a single-layer material at microwave frequencies : Theory and Experiments

F. Sagnard D. Seetharamdoo Christophe Vignat 1
1 ligm - Laboratoire d'Informatique Gaspard-Monge
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Conference papers
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https://hal-upec-upem.archives-ouvertes.fr/hal-00621814
Contributor : Christophe Vignat <>
Submitted on : Sunday, September 11, 2011 - 1:14:31 PM
Last modification on : Wednesday, February 26, 2020 - 7:06:05 PM

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  • HAL Id : hal-00621814, version 1

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F. Sagnard, D. Seetharamdoo, Christophe Vignat. Reflection ellipsometry for in-situ measurements of complex permittivity and thickness of a single-layer material at microwave frequencies : Theory and Experiments. 32nd EUMC, Sep 2002, Milan, France. 10pp. ⟨hal-00621814⟩

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