Reflection ellipsometry for in-situ measurements of complex permittivity and thickness of a single-layer material at microwave frequencies : Theory and Experiments

F. Sagnard D. Seetharamdoo Christophe Vignat 1
1 LIGM - Laboratoire d'Informatique Gaspard-Monge
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Conference papers
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https://hal-upec-upem.archives-ouvertes.fr/hal-00621814
Contributor : Christophe Vignat <>
Submitted on : Sunday, September 11, 2011 - 1:14:31 PM
Last modification on : Wednesday, April 11, 2018 - 12:12:02 PM

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F. Sagnard, D. Seetharamdoo, Christophe Vignat. Reflection ellipsometry for in-situ measurements of complex permittivity and thickness of a single-layer material at microwave frequencies : Theory and Experiments. 32nd EUMC, Sep 2002, Milan, France. 10pp. ⟨hal-00621814⟩

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