Reflection ellipsometry for in-situ measurements of complex permittivity and thickness of a single-layer material at microwave frequencies : Theory and Experiments

F. Sagnard; D. Seetharamdoo; Christophe Vignat

Conference papers

Reflection ellipsometry for in-situ measurements of complex permittivity and thickness of a single-layer material at microwave frequencies : Theory and Experiments

F. Sagnard D. Seetharamdoo Christophe Vignat ¹

1 ligm - Laboratoire d'Informatique Gaspard-Monge

Document type :

Conference papers

Domain :

Computer Science [cs] / Computation and Language [cs.CL]

Complete list of metadatas

https://hal-upec-upem.archives-ouvertes.fr/hal-00621814
Contributor : Christophe Vignat <>
Submitted on : Sunday, September 11, 2011 - 1:14:31 PM
Last modification on : Thursday, September 10, 2020 - 6:10:02 PM

Reflection ellipsometry for in-situ measurements of complex permittivity and thickness of a single-layer material at microwave frequencies : Theory and Experiments

Identifiers

Collections

Citation

Export

Metrics

133

Reflection ellipsometry for in-situ measurements of complex permittivity and thickness of a single-layer material at microwave frequencies : Theory and Experiments

Identifiers

Collections

Citation

Export

Share

Metrics

133