An 850 nm SiGe/Si HPT with a 4.12 GHz maximum optical transition frequency and 0.805A/W responsivity

Abstract : A 10 × 10 mm 2 SiGe heterojunction bipolar photo-transistor (HPT) is fabricated using a commercial technological process of 80 GHz SiGe bipolar transistors (HBT). Its technology and structure are first briefly described. Its optimal opto-microwave dynamic performance is then analyzed versus voltage biasing conditions for opto-microwave continuous wave measurements. The optimal biasing points are then chosen in order to maximize the optical transition frequency (f Topt) and the opto-microwave responsivity of the HPT. An opto-microwave scanning near-field optical microscopy (OM-SNOM) is performed using these optimum bias conditions to localize the region of the SiGe HPT with highest frequency response. The OM-SNOM results are key to extract the optical coupling of the probe to the HPT (of 32.3%) and thus the absolute respon-sivity of the HPT. The effect of the substrate is also observed as it limits the extraction of the intrinsic HPT performance. A maximum optical transition frequency of 4.12 GHz and an absolute low frequency opto-microwave responsivity of 0.805A/W are extracted at 850 nm.
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Submitted on : Tuesday, January 24, 2017 - 10:37:39 AM
Last modification on : Thursday, February 7, 2019 - 4:49:27 PM

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Zerihun Tegegne, Carlos Viana, Marc Rosales, Julien Schiellein, Jean-Luc Polleux, et al.. An 850 nm SiGe/Si HPT with a 4.12 GHz maximum optical transition frequency and 0.805A/W responsivity. International Journal of Microwave and Wireless Technologies, Cambridge University Press/European Microwave Association 2017, 9 (1), pp.17-24. ⟨https://www.cambridge.org/core/journals/international-journal-of-microwave-and-wireless-technologies/article/div-classtitlean-850-nm-sigesi-hpt-with-a-412-ghz-maximum-optical-transition-frequency-and-0805aw-responsivitydiv/1A314D63BF0FBF507DACCD3E298174B7⟩. ⟨10.1017/S1759078715001531⟩. ⟨hal-01436955⟩

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