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Journal articles
Opto-microwave Experimental Mapping of SiGe/Si Phototransistors at 850nm
Marc Rosales
1
Frédéric Duport
1
Julien Schiellein
1
Jean-Luc Polleux
1
Catherine Algani
1
Christian Rumelhard
1
Marc Rosales 1
Author
Frédéric Duport 1
Author
Julien Schiellein 1
Author
Jean-Luc Polleux 1
Author IdHAL : jean-luc-polleux ORCID : https://orcid.org/0000-0003-2165-7979
Catherine Algani 1
Author
Christian Rumelhard 1
Author
1
ESYCOM - Electronique, Systèmes de communication et Microsystèmes (Université de Paris-Est - Marne-la-Vallée, Cité Descartes, Bâtiment Copernic, 5 bd Descartes, 77454 Marne-la-Vallée Cedex 2 - France)
- CNAM - Conservatoire National des Arts et Métiers [CNAM] : EA2552 (France)
- UPEM - Université Paris-Est Marne-la-Vallée : EA2552 (5 boulevard Descartes - Champs-sur-Marne - 77454 Marne-la-Vallée Cedex 2 - France)
- ESIEE Paris (2 boulevard Blaise Pascal Cité Descartes BP 99 93162 Noisy-le-Grand Cedex - France)
Document type :
Journal articles
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Complete list of metadata
https://hal-upec-upem.archives-ouvertes.fr/hal-00783994
Contributor : Catherine Algani Connect in order to contact the contributor
Submitted on : Saturday, February 2, 2013 - 4:10:55 PM
Last modification on : Tuesday, June 2, 2020 - 7:36:03 AM
Contributor : Catherine Algani Connect in order to contact the contributor
Submitted on : Saturday, February 2, 2013 - 4:10:55 PM
Last modification on : Tuesday, June 2, 2020 - 7:36:03 AM
Identifiers
- HAL Id : hal-00783994, version 1
Citation
Marc Rosales, Frédéric Duport, Julien Schiellein, Jean-Luc Polleux, Catherine Algani, et al.. Opto-microwave Experimental Mapping of SiGe/Si Phototransistors at 850nm. International Journal of Microwave and Wireless Technologies, Cambridge University Press/European Microwave Association 2009, 1 (6), pp.469-473. ⟨hal-00783994⟩
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