Collecting XAFS spectra at soft X-ray energies in a heated loop cell up to 1600 K

Abstract : A new device to collect in-situ-, high-temperature XAFS spectra is presented which runs at low x-ray energies (K edges from Na to Cl). XAFS data is collected in the fluorescence mode (Ge solid state detector) using a heated loop that contains the sample. The actual temperature is measured using an optical pyrometer and a thermocouple (temperatures are +/- 20 K at 1500 K). The first XAFS spectra were collected at the Si K-edge, with 0.2 eV steps, on the ABS1 spectrometer at Super-AGO (LURE, Orsay). The study of the melting of a Na2Si2O5 glass is an example of the possibilities offered by this new area of research.
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F Farges, Am Flank, P Lagarde, F Tenegal. Collecting XAFS spectra at soft X-ray energies in a heated loop cell up to 1600 K. Journal of Synchrotron Radiation, International Union of Crystallography, 1999, 6 (?), pp.193--194. ⟨10.1107/S0909049598017749⟩. ⟨hal-00694242⟩

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