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In Situ Measurements of the Complex Permittivity of Materials Using Reflection Ellipsometry in the Microwave Band: Experiments (Part II)
1
ESYCOM - Electronique, Systèmes de communication et Microsystèmes (Université de Paris-Est - Marne-la-Vallée, Cité Descartes, Bâtiment Copernic, 5 bd Descartes, 77454 Marne-la-Vallée Cedex 2 - France)
- CNAM - Conservatoire National des Arts et Métiers [CNAM] : EA2552 (France)
- UPEM - Université Paris-Est Marne-la-Vallée : EA2552 (5 boulevard Descartes - Champs-sur-Marne - 77454 Marne-la-Vallée Cedex 2 - France)
- ESIEE Paris (2 boulevard Blaise Pascal Cité Descartes BP 99 93162 Noisy-le-Grand Cedex - France)
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ligm - Laboratoire d'Informatique Gaspard-Monge (Université de Paris-Est Marne-la-Vallée, Cité Descartes, Bâtiment Copernic, 5 bd Descartes, 77454 Marne-la-Vallée Cedex 2 - France)
- UPEM - Université Paris-Est Marne-la-Vallée (5 boulevard Descartes - Champs-sur-Marne - 77454 Marne-la-Vallée Cedex 2 - France)
- ENPC - École des Ponts ParisTech (École des Ponts ParisTech 6-8 avenue Blaise-Pascal Cité Descartes 77455 Champs-sur-Marne Marne-la-Vallée cedex 2 - France)
- ESIEE Paris (2 boulevard Blaise Pascal Cité Descartes BP 99 93162 Noisy-le-Grand Cedex - France)
- Fédération de Recherche Bézout (France)
- CNRS - Centre National de la Recherche Scientifique : UMR8049 (France)
Document type :
Journal articles
Complete list of metadatas
https://hal-upec-upem.archives-ouvertes.fr/hal-00621848
Contributor : Christophe Vignat <>
Submitted on : Sunday, September 11, 2011 - 1:17:53 PM
Last modification on : Wednesday, February 26, 2020 - 7:06:08 PM
Contributor : Christophe Vignat <>
Submitted on : Sunday, September 11, 2011 - 1:17:53 PM
Last modification on : Wednesday, February 26, 2020 - 7:06:08 PM
Identifiers
- HAL Id : hal-00621848, version 1
Collections
CNRS | ENPC | PARISTECH | LIGM_SIGNAL | LIGM | ESYCOM | UNIV-MLV | ESYCOM_EAM | CV_ESYCOM | UPEC-UPEM | CNAM | ESIEE-PARIS
Citation
F. Sagnard, F. Bentabet, Christophe Vignat. In Situ Measurements of the Complex Permittivity of Materials Using Reflection Ellipsometry in the Microwave Band: Experiments (Part II). IEEE Transactions on Instrumentation and Measurement, Institute of Electrical and Electronics Engineers, 2005, 54 (3), pp.1274-1282. ⟨hal-00621848⟩
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