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In Situ Measurements of the Complex Permittivity of Materials Using Reflection Ellipsometry in the Microwave Band: Experiments (Part II)

F. Sagnard 1 F. Bentabet Christophe Vignat 2
1 ESYCOM - Electronique, Systèmes de communication et Microsystèmes
2 ligm - Laboratoire d'Informatique Gaspard-Monge
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https://hal-upec-upem.archives-ouvertes.fr/hal-00621848
Contributor : Christophe Vignat <>
Submitted on : Sunday, September 11, 2011 - 1:17:53 PM
Last modification on : Thursday, September 10, 2020 - 6:10:02 PM

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  • HAL Id : hal-00621848, version 1

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Citation

F. Sagnard, F. Bentabet, Christophe Vignat. In Situ Measurements of the Complex Permittivity of Materials Using Reflection Ellipsometry in the Microwave Band: Experiments (Part II). IEEE Transactions on Instrumentation and Measurement, Institute of Electrical and Electronics Engineers, 2005, 54 (3), pp.1274-1282. ⟨hal-00621848⟩

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