In Situ Measurements of the Complex Permittivity of Materials Using Reflection Ellipsometry in the Microwave Band: Experiments (Part II)

F. Sagnard 1 F. Bentabet Christophe Vignat 2
1 ESYCOM - Electronique, Systèmes de communication et Microsystèmes
2 LIGM - Laboratoire d'Informatique Gaspard-Monge
Document type :
Journal articles
Complete list of metadatas
https://hal-upec-upem.archives-ouvertes.fr/hal-00621848
Contributor : Christophe Vignat <>
Submitted on : Sunday, September 11, 2011 - 1:17:53 PM
Last modification on : Thursday, February 7, 2019 - 4:44:58 PM

Identifiers

  • HAL Id : hal-00621848, version 1

Collections

PARISTECH | ENPC | LIGM_SIGNAL | LIGM | ESYCOM_EAM | CV_ESYCOM | ESYCOM | UNIV-MLV | UPEC-UPEM | ESIEE-PARIS

Citation

F. Sagnard, F. Bentabet, Christophe Vignat. In Situ Measurements of the Complex Permittivity of Materials Using Reflection Ellipsometry in the Microwave Band: Experiments (Part II). IEEE Tr. Instr. and Measurements, 2005, 54 (3), pp.1274-1282. ⟨hal-00621848⟩

Export

BibTeX TEI DC DCterms EndNote

Share

Metrics

Record views

204

Contact

support.ccsd.cnrs.fr
hal.support@ccsd.cnrs.fr
Logo CCSD